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Assigned to the (002) plane of graphite

The strong and sharp X-ray diffraction (XRD) peak at 26.36° can be assigned to the (002) plane of Graphite. The lattice spacing of d (002) is calculated to be 3.38 Å by bulk Graphite, suggesting a high degree of graphitization of Graphite. This conclusion can also be drawn from the Raman spectrum. The intensity ratio of the strong G band around 1582 cm–1 to the weak D band around 1350 cm–1 is as high as ~3.9. Besides, a strong 2D band around 2703 cm–1, corresponding to highly ordered graphitic carbon, is observed in the Raman spectrum of Graphite. The as-synthesized Graphite can be further demonstrated to be a high degree of graphitization by XPS (X-ray photoelectron spectroscopy) spectra. A very small amount of O was detected in the as-synthesized Graphite, in which O is chemically bonding with C. For the C element, the intensity of the sp2-C peak is much greater than that of the sp3-C peak, as shown in the high-resolution XPS spectrum of C 1s. The SEM, TEM, HRTEM, and SAED images of as-synthesized Graphite. It exhibits a flake-shaped morphology with a thickness of 160–350 nm. The submicroflake-shaped morphology can be observed in the TEM and HRTEM images. The d-spacing of graphite submicroflakes determined by the HRTEM image is about 0.333 nm, by the XRD result above, and the values of Graphite previously reported. The HRTEM image and SAED pattern further confirm the formation of the graphitic phase. The surface area of graphite submicroflakes is 14.5 m2 g−1, calculated by the Brunauer-Emmett-Teller model. If you are looking for high quality, high purity, and cost-effective Graphite, or if you require the latest price, please feel free to email contact mis-asia.

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